ionel eduard stan
University of Milano-Bicocca
Milan, Italy
Associate Editor
Pattern Recognition
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Associate Editors
eva tuba
Trinity University
San Antonio, United States
Associate Editor
Pattern Recognition
milan tuba
Singidunum University
Belgrade, Serbia
Associate Editor
Pattern Recognition
milan tuba
Singidunum University
Belgrade, Serbia
Associate Editor
Pattern Recognition
kele xu
National University of Defense Technology
Changsha, China
Associate Editor
Pattern Recognition
zitong yu
Great Bay University
Dongguan, China
Associate Editor
Pattern Recognition
simone zini
Department of Informatics, Systems and Communication , University of Milano-Bicocca
Milano, Italy
Associate Editor
Pattern Recognition
Review Editors
anupam agrawal
Indian Institute of Information Technology, Allahabad
Allahabad, India
Review Editor
Pattern Recognition
jamil ahmad
Department of Information System and Security, College of Information Technology, United Arab Emirates University, United Arab Emirates
Al Ain, United Arab Emirates
Review Editor
Pattern Recognition
muhammad ahmad
University of Messina
Messina, Italy
Review Editor
Pattern Recognition
zafar ali
School of Computer Science and Engineering, Southeast University
Nanjing, China
Review Editor
Pattern Recognition
adis alihodžić
University of Sarajevo
Sarajevo, Bosnia and Herzegovina
Review Editor
Pattern Recognition
roohallah alizadehsani
Deakin University
Geelong, Australia
Review Editor
Pattern Recognition
rĂşbia eliza de oliveira schultz ascari
Federal Technological University of Paraná
Curitiba, Brazil
Review Editor
Pattern Recognition
indriyati atmosukarto
Singapore Institute of Technology
Singapore, Singapore
Review Editor
Pattern Recognition
vinoth kumar b
PSG College of Technology
Coimbatore, India
Review Editor
Pattern Recognition