Original Research
Published on 25 Jun 2025
Characterizing sample degradation from synchrotron based X-ray measurements of ultra-thin exfoliated flakes
Frontiers in Electronic Materials
doi 10.3389/femat.2025.1572940
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Original Research
Published on 25 Jun 2025
Original Research
Accepted on 23 Jun 2025
Mini Review
Published on 06 Feb 2025