yan xia
University of Illinois at Urbana-Champaign
Champaign, United States
Review Editor
Assessment, Testing and Applied Measurement
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yangyu xiao
The Chinese University of Hong Kong, Shenzhen
Shenzhen, China
Review Editor
Assessment, Testing and Applied Measurement
ying xu
South China University of Technology
Guangzhou, China
Review Editor
Assessment, Testing and Applied Measurement
haci bayram yilmaz
University of Aberdeen
Aberdeen, United Kingdom
Review Editor
Assessment, Testing and Applied Measurement
min yang
The Education University of Hong Kong
Tai Po, Hong Kong, SAR China
Review Editor
Assessment, Testing and Applied Measurement
ibrahim yildirim
University of Gaziantep
Gaziantep, Türkiye
Review Editor
Assessment, Testing and Applied Measurement
mehrdad yousefpoori-naeim
University of Alberta
Edmonton, Canada
Review Editor
Assessment, Testing and Applied Measurement
hulya yurekli
Yıldız Technical University
Istanbul, Türkiye
Review Editor
Assessment, Testing and Applied Measurement
quan zhang
Jiaxing University
Jiaxing, China
Review Editor
Assessment, Testing and Applied Measurement
diego zapata-rivera
Educational Testing Service
Princeton, United States
Review Editor
Assessment, Testing and Applied Measurement
ji zeng
Michigan Department of Education
Lansing, United States
Review Editor
Assessment, Testing and Applied Measurement
lisa zimmerman
University of South Africa
Pretoria, South Africa
Review Editor
Assessment, Testing and Applied Measurement
bruno d. zumbo
University of British Columbia
Vancouver, Canada
Review Editor
Assessment, Testing and Applied Measurement
natascha van hattum-janssen
Saxion University
Enschede, Netherlands
Review Editor
Assessment, Testing and Applied Measurement
ibrahim burak ölmez
MEF University
Istanbul, Türkiye
Review Editor
Assessment, Testing and Applied Measurement